Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong province,
Shenzhen University, No.3688, Nanhai Road, Nanshan District, Shenzhen 518060, China
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong province,
Shenzhen University, No.3688, Nanhai Road, Nanshan District, Shenzhen 518060, China
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong province,
Shenzhen University, No.3688, Nanhai Road, Nanshan District, Shenzhen 518060, China
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong province,
Shenzhen University, No.3688, Nanhai Road, Nanshan District, Shenzhen 518060, China
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong province,
Shenzhen University, No.3688, Nanhai Road, Nanshan District, Shenzhen 518060, China
Copyright © 2013 Shengxun Su, Changxiao Pan, Xi Luo, Wei Chen, Jiarong Lian et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
S. Su, C. Pan, X. Luo, W. Chen and J. Lian, "Dependence Study of Optoelectronics Performance on Carefully Differed LiF Thickness in Alq
3 Based OLEDs,"
Optics and Photonics Journal, Vol. 3 No. 2B, 2013, pp. 256-259. doi:
10.4236/opj.2013.32B060.