American Journal of Plant Sciences
Vol.4 No.7(2013), Paper ID 34752, 6
pages
DOI:10.4236/ajps.2013.47181
Yield Evaluation of a Wheat Line with Combined Resistance to Russian Wheat Aphid and Stem Rust Race “Ug99” in Kenya
F. O. Amulaka, J. N. Maling’a, R. S. Pathak, M. Cakir, R. M. S. Mulwa
Egerton University, Department of Crops, Horticulture and Soils, Egerton, Kenya;
Kenya Agricultural Research Institute (KARI), Njoro, Kenya.
Egerton University, Department of Crops, Horticulture and Soils, Egerton, Kenya
Murdoch University, Perth, Australia
Egerton University, Department of Crops, Horticulture and Soils, Egerton, Kenya;
Copyright © 2013 F. O. Amulaka, J. N. Maling’a, R. S. Pathak, M. Cakir, R. M. S. Mulwa et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
F. Amulaka, J. Maling’a, R. Pathak, M. Cakir and R. Mulwa, "Yield Evaluation of a Wheat Line with Combined Resistance to Russian Wheat Aphid and Stem Rust Race “Ug99” in Kenya,"
American Journal of Plant Sciences, Vol. 4 No. 7, 2013, pp. 1494-1499. doi:
10.4236/ajps.2013.47181.