Journal of Surface Engineered Materials and Advanced Technology
Vol.3 No.3(2013), Paper ID 34221, 5
pages
DOI:10.4236/jsemat.2013.33026
Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy
Kenny Lau, Yun Liu, Qian Li, Zhenrong Li, Ray L. Withers, Zhuo Xu
Research School of Chemistry, The Australian National University, Canberra, Australia
Research School of Chemistry, The Australian National University, Canberra, Australia;
Research School of Chemistry, The Australian National University, Canberra, Australia
Electronic Materials Research Laboratory, Xi’an Jiaotong University, Xi’an, China.
Research School of Chemistry, The Australian National University, Canberra, Australia;
Electronic Materials Research Laboratory, Xi’an Jiaotong University, Xi’an, China.
Copyright © 2013 Kenny Lau, Yun Liu, Qian Li, Zhenrong Li, Ray L. Withers, Zhuo Xu et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
Lau, K. , Liu, Y. , Li, Q. , Li, Z. , Withers, R. and Xu, Z. (2013) Surface Characterisation of a Ferroelectric Single Crystal by Kelvin Probe Force Microscopy.
Journal of Surface Engineered Materials and Advanced Technology,
3, 190-194. doi:
10.4236/jsemat.2013.33026.