Open Journal of Microphysics

Vol.3 No.2(2013), Paper ID 31500, 5 pages

DOI:10.4236/ojm.2013.32005

 

Checking of XRF Observations with Matrix Terms Involved in Sample Analysis

 

Meenakshi Bansal, Kanan Deep, Raj Mittal

 

Nuclear Science Laboratories, Physics Department, Punjabi University, Patiala, India
Nuclear Science Laboratories, Physics Department, Punjabi University, Patiala, India
Nuclear Science Laboratories, Physics Department, Punjabi University, Patiala, India

 

Copyright © 2013 Meenakshi Bansal, Kanan Deep, Raj Mittal et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


M. Bansal, K. Deep and R. Mittal, "Checking of XRF Observations with Matrix Terms Involved in Sample Analysis," Open Journal of Microphysics, Vol. 3 No. 2, 2013, pp. 23-27. doi: 10.4236/ojm.2013.32005.

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