Advances in Materials Physics and Chemistry

Vol.3 No.1A(2013), Paper ID 30340, 7 pages

DOI:10.4236/ampc.2013.31A007

 

Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases

 

Steve J. Chipera, David L. Bish

 

Chesapeake Energy Corporation, Oklahoma City, Oklahoma, USA
Indiana University, Bloomington, Indiana, USA

 

Copyright © 2013 Steve J. Chipera, David L. Bish et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


S. Chipera and D. Bish, "Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases," Advances in Materials Physics and Chemistry, Vol. 3 No. 1A, 2013, pp. 47-53. doi: 10.4236/ampc.2013.31A007.

Copyright © 2024 by authors and Scientific Research Publishing Inc.

Creative Commons License

This work and the related PDF file are licensed under a Creative Commons Attribution 4.0 International License.