Advances in Materials Physics and Chemistry
Vol.3 No.1A(2013), Paper ID 30340, 7 pages
DOI:10.4236/ampc.2013.31A007
Fitting Full X-Ray Diffraction Patterns for Quantitative Analysis: A Method for Readily Quantifying Crystalline and Disordered Phases
Steve J. Chipera, David L. Bish
Chesapeake Energy Corporation, Oklahoma City, Oklahoma, USA Indiana University, Bloomington, Indiana, USA
Copyright © 2013 Steve J. Chipera, David L. Bish et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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