Journal of Electronics Cooling and Thermal Control

Vol.3 No.1(2013), Paper ID 29399, 5 pages

DOI:10.4236/jectc.2013.31003

 

Measurement of Film Thickness on a Curved Surface by Fiber Optic Probe

 

C. Buffone, A. Glushchuk, C. S. Iorio, F. Dubois

 

Microgravity Research Centre, Universitè Libre de Bruxelles, Bruxelles, Belgium
Microgravity Research Centre, Universitè Libre de Bruxelles, Bruxelles, Belgium
Microgravity Research Centre, Universitè Libre de Bruxelles, Bruxelles, Belgium
Microgravity Research Centre, Universitè Libre de Bruxelles, Bruxelles, Belgium

 

Copyright © 2013 C. Buffone, A. Glushchuk, C. S. Iorio, F. Dubois et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Buffone, C. , Glushchuk, A. , Iorio, C. and Dubois, F. (2013) Measurement of Film Thickness on a Curved Surface by Fiber Optic Probe. Journal of Electronics Cooling and Thermal Control, 3, 22-26. doi: 10.4236/jectc.2013.31003.

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