Institute of Laser Engineering, Osaka University, Osaka, Japan.
Institute of Laser Engineering, Osaka University, Osaka, Japan.
Institute of Laser Engineering, Osaka University, Osaka, Japan.
Institute of Laser Engineering, Osaka University, Osaka, Japan.
Copyright © 2013 Ryuhei Kinjo, Iwao Kawayama, Hironaru Murakami, Masayoshi Tonouchi et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
R. Kinjo, I. Kawayama, H. Murakami and M. Tonouchi, "Thickness Dependence of Dielectric Characteristics of SrTiO
3 Thin Films on MgAl
2O
4 Substrates,"
Advances in Materials Physics and Chemistry, Vol. 3 No. 1, 2013, pp. 58-61. doi:
10.4236/ampc.2013.31009.