General Chemistry Laboratory, School of Chemical Engineering, National Technical University of Athens, Athens, Greece
General Chemistry Laboratory, School of Chemical Engineering, National Technical University of Athens, Athens, Greece
Copyright © 2012 Mirtat Bouroushian, Tatjana Kosanovic et al. This is
an open access article distributed under the Creative Commons Attribution
License, which permits unrestricted use, distribution, and reproduction in any
medium, provided the original work is properly cited.
How to Cite this Article
M. Bouroushian and T. Kosanovic, "Characterization of Thin Films by Low Incidence X-Ray Diffraction,"
Crystal Structure Theory and Applications, Vol. 1 No. 3, 2012, pp. 35-39. doi:
10.4236/csta.2012.13007.