American Journal of Plant Sciences

Vol.3 No.8(2012), Paper ID 22164, 4 pages

DOI:10.4236/ajps.2012.38124

 

Genetic Variation for Grain Yield and Yield Related Traits in Tef [Eragrostis tef (Zucc.)Trotter] under Moisture Stress and Non-Stress Environments

 

Wondewosen Shiferaw, Alemayehu Balcha, Hussen Mohammed

 

Jinka Agricultural Research Centre, South Agricultural Research Institute, Hawassa, Ethiopia
School of Agricultural Science, Dilla University, Dilla, Ethiopia
Department of Plant and Horticultural Sciences, Hawassa University, Hawassa, Ethiopia

 

Copyright © 2012 Wondewosen Shiferaw, Alemayehu Balcha, Hussen Mohammed et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Shiferaw, W. , Balcha, A. and Mohammed, H. (2012) Genetic Variation for Grain Yield and Yield Related Traits in Tef [Eragrostis tef (Zucc.)Trotter] under Moisture Stress and Non-Stress Environments. American Journal of Plant Sciences, 3, 1041-1046. doi: 10.4236/ajps.2012.38124.

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