Journal of Modern Physics

Vol.3 No.7(2012), Paper ID 21098, 8 pages

DOI:10.4236/jmp.2012.37074

 

Annealing Effects on Electrical Properties and Interfacial Reactions of Ni/Cu Schottky Rectifiers on n-Type InP

 

Yerpedu Munikrishna Reddy, M. K. Nagaraj, S. Sankar Naik, V. Rajagopal Reddy

 

Department of Physics, SSBN Degree and PG College, Anantapur, India
Department of Physics, Rayalaseema University, Kurnool, India
Department of Physics, Sri Venkateswara University, Tirupati, India
Department of Physics, Sri Venkateswara University, Tirupati, India

 

Copyright © 2012 Yerpedu Munikrishna Reddy, M. K. Nagaraj, S. Sankar Naik, V. Rajagopal Reddy et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

 

How to Cite this Article


Y. Reddy, M. Nagaraj, S. Naik and V. Reddy, "Annealing Effects on Electrical Properties and Interfacial Reactions of Ni/Cu Schottky Rectifiers on n-Type InP," Journal of Modern Physics, Vol. 3 No. 7, 2012, pp. 538-545. doi: 10.4236/jmp.2012.37074.

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