On the Production Testing of Memristor Ratioed Logic (MRL) Gates

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Circuits and Systems

ISSN Print: 2153-1285
ISSN Online: 2153-1293
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"On the Production Testing of Memristor Ratioed Logic (MRL) Gates"
written by Ahmed Shukry Emara, Ahmed Hassan Madian, Hassanein Hamed Amer, Sherif Hassanein Amer, Mohamed Bakr Abdelhalim,
published by Circuits and Systems, Vol.7 No.10, 2016

has been cited by the following article(s):

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[1]	A Testability Enhancement Method for the Memristor Ratioed Logic Circuits
	2020

[2]	Memristive Circuit Design of Five-Person Voter Based on Memristor Ratioed Logic
	2020

[3]	Testing of memristor ratioed logic (MRL) XOR gate
	2016

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Circuits and Systems

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