Joint Operation of Atomic Force Microscope and Advanced Laser Confocal Microscope for Observing Surface Processes in a Protein Crystal

Shin-ichiro Yanagiya, Nobuo Goto

Institute of Technology and Science, University of Tokushima, Tokushima, Japan..

DOI: 10.4236/jsemat.2012.223032                

Abstract

We demonstrated the insitu observation of a moving atomic force microscope (AFM) cantilever using a laser confocal microscope combined with a differential interference microscope (LCM-DIM). The AFM cantilever scanned or indented the {110} surface of a hen egg-white lysozyme crystal in a supersaturated solution. Using a soft cantilever, we could observe the step growth with high time resolution by LCM-DIM and perform quantitative measurements of the step height by AFM simultaneously. In addition, a hard cantilever was used with LCM-DIM to observe the dynamics of crystal surface scratching and indentation. In the supersaturated solution, the small steps generated from the scratched line aggregated to macro steps, and subsequently flattened the surface.

Keywords

Laser Confocal Microscopy; Atomic Force Microscopy; Surface Process; Protein Crystal

Conflicts of Interest

The authors declare no conflicts of interest.

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