[1]
|
P. Farnsworth, “Electrical Discharge Device for Producing Interaction between Nuclei,” US Patent No. 3258402, 1966.
|
[2]
|
K. Yamauchi, Y. Takenchi, Y. Ogino, M. Watanabe, A. Okino, Y. Sunaga and E. Hotta, “Neutron Production Rate and Plasma Characteristics of Spherically Convergent Beam Fusion,” Electrical Engineering in Japan, Vol. 135, No. 2, 2001, pp. 1-8. doi:10.1002/eej.1
|
[3]
|
H. Shao, G. Lui, Z. Yang, C. Chen, Z. Song and W. Huang, “Characterization of Modes in Coaxial Vircator,” IEEE Transactions on Plasma Science, Vol. 34, No. 1, 2006, pp. 7-13. doi:10.1109/TPS.2005.863895
|
[4]
|
A. E. Wendt, M. A. Liberman and H. Meuth, “Radial Current Distribution at a Planar Magnetron Cathode,” Journal of Vacuum Science & Technology A, Vol. 6, No. 3, 1988, pp. 1827-1831. doi:10.1116/1.575263
|
[5]
|
G. H. Miley, Y. Gu, J. M. DeMora, R. A. Stubbers, T. A. Hochberg, J. H. Nadler and R. A. Anderl, “Discharge Characteristics of the Spherical Inertial Electrostatic Confinement (IEC) Device,” IEEE Transactions on Plasma Science, Vol. 25, No. 4, 1997, pp. 733-739.
doi:10.1109/27.640696
|
[6]
|
Tsv. K. Popov, M. Dimitrova and F. M. Dias, “Determination of the Electron Density in Current-Less Argon Plasma Using Langmuir Probe Measurements,” Vacuum, Vol. 76, No. 2-3, 2004, pp. 417-420.
doi:10.1016/j.vacuum.2004.07.079
|
[7]
|
Y. Gu and G. H. Miley, “Experimental Study of Potential Structure in a Spherical IEC Fusion Device,” IEEE Transactions on Plasma Science, Vol. 28, No. 1, 2000, pp. 331-346. doi:10.1109/27.842929
|
[8]
|
A. Von Engel, “Electric Plasmas, Their Nature and Uses,” Taylor and Francis, London, 1983.
|
[9]
|
E. Passoth, P. Kudrna, C. Csambal, J. F. Behnke, M. Tichy and V. Helbig, “An Experimental Study of Plasma Density Determination by a Cyliderical Langmuir Probe at Different Pressures and Magnetic Fields in a Cylindrical Magnetron Discharge in Heavy Rare Gases,” Journal of Physics D: Applied Physics, Vol. 30, No. 12, 1997, pp. 1763-1777. doi:10.1088/0022-3727/30/12/013
|
[10]
|
V. I. Kolobov and L. D. Tsendin, “Analytic Model of the Cathode Region of a Short Glow Discharge in Light Gases,” Physical Review A, Vol. 46, No. 12, 1992, pp. 7837-7852. doi:10.1103/PhysRevA.46.7837
|
[11]
|
V. A. Godyak, R. B. Piejak and B. M. Alexandrovich, “Measurements of Electron Energy Distribution in Low Pressure RF Discharges,” Plasma Sources Science Technology, Vol. 1, No. 1, 1992, pp. 36-58.
doi:10.1088/0963-0252/1/1/006
|
[12]
|
F. F. El-akshar, M. A. Hassouba and A. A. Graramoon, “Measurements of the Electron Energy Distribution Function in Two Different Regions of DC-Magnetron Sputtering Device,” Fizika A, Vol. 9, No. 4, 2000, pp. 177-186.
|
[13]
|
B. Koo, N. Hershkowitz and M. Sarfaty, “Langmuir Probe in Low Temperature Magnetized Plasmas: Theory and Experimental Verification,” Journal of Applied Physics, Vol. 86, No. 3, 1999, pp. 1213-1220.
doi:10.1063/1.370873
|
[14]
|
J. R. Roth, “Industrial Plasma Engineering, Volume 1,” Institute of Physics Publishing, London, 1995.
doi:10.1201/9781420050868
|
[15]
|
R. Hippler, S. Pfau, M. Schmidt and H. K. Schoenbach, “Low Temperature Plasma Physics,” Wiley-VCH, Berlin, 2001.
|
[16]
|
L. G. Grechko, V. I. Sugakov, O. F. Tomasevich and A. M. Fedorchenko, “Problems in Thermal Physics,” Mir Publishers, Moscow, 1977.
|
[17]
|
D. Fang and R. K. Marcus, “Use of Cylindrical Langmuir Probe for the Characterization of Charged Particle Populations in a Planar Diode Glow Discharge Device,” Spectrochimica Acta, Vol. 45 B, No. 9, 1990, pp. 1053-1074
|
[18]
|
M. B. Hopkins and W. G. Graham, “Langmuir Probe Technique for Plasma Parameter Measurement in a Medium Density Discharge,” Review of Scientific Instruments, Vol. 57, No. 9, 1986, pp. 2210-2217.
doi:10.1063/1.1138684
|
[19]
|
B. M. Annaratone, M. W. Allen and J. E. Allen, “Ion Currents to Cylindrical Langmuir Probes in RF Plasmas,” Journal of Physics D: Applied Physics, Vol. 25, No. 3, 1992, pp. 417-424. doi:10.1088/0022-3727/25/3/012
|
[20]
|
I. D. Sudit and R. C. Woods, “Study of the Accuracy of Various Langmuir Probe Theories,” Journal of Applied Physics, Vol. 76, No. 8, 1994, pp. 4488-4498.
doi:10.1063/1.357280
|