Technology and Application of Electronic Information (TAEI 2009 E-BOOK)

Zhan Jiang,China,7.28-7.31，2009

ISBN: 978-1-935068-04-4 Scientific Research Publishing, USA

E-Book 468pp Pub. Date: November 2009

Category: Physics & Mathematics

Price: $80

Title:	Design of Circuit Parameter Measurement System on NiosⅡ
Source:	Technology and Application of Electronic Information (TAEI 2009 E-BOOK) (pp 378-381)
Author(s):	Hailin Yuan, Hubei Institute for Nationalities，Enshi, China
Abstract:	This article studies a new design method of the circuitry parameter measurement system based on SOPC technique. This system realizes the measurement of all the parameters of the measured-Circuit in high precision, by the Nios soft Ⅱ core CPU and measuring and controlling model configured in FPGA chip to construct hardware platform of the Embedded System, by using the software to control the measure module of the frequency, phase, voltage and current.

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