Author(s): |
Cheng-fu Zheng, National Anti-Counterfeit Engineering Research Center, Wuhan, China Nian-wu Li, National Anti-Counterfeit Engineering Research Center, Wuhan, China Shi-hui Zhu, National Anti-Counterfeit Engineering Research Center, Wuhan, China Xing-jun Lv, HuaGong Image Technology &Development Co.,Ltd, Wuhan, China Fan-di Zeng, College of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan, China School of Physics Science and Technology, Xinjiang University, Urumqi, Xinjiang, 830046 |