Author(s): |
Wei Zhao, Faculty of Microelectronics, Nanjing College of Information Technology, NJCIT, Nanjing, China Hong Jin, Faculty of Microelectronics, Nanjing College of Information Technology, NJCIT, Nanjing, China Sen Chen, Faculty of Microelectronics, Nanjing College of Information Technology, NJCIT, Nanjing, China Chun-bao Zhao, Faculty of Microelectronics, Nanjing College of Information Technology, NJCIT, Nanjing, China Xian-zhong Zhu, Faculty of Microelectronics, Nanjing College of Information Technology, NJCIT, Nanjing, China |