TITLE:
Experimental Measurement of Minority Carriers Effective Lifetime in Silicon Solar Cell Using Open Circuit Voltage Decay under Magnetic Field in Transient Mode
AUTHORS:
Alain Diasso, Raguilignaba Sam, Bernard Zouma, François Zougmoré
KEYWORDS:
Carrier Lifetime, Fitting, Magnetic Field, Open Circuit Voltage Decay
JOURNAL NAME:
Smart Grid and Renewable Energy,
Vol.11 No.11,
November
26,
2020
ABSTRACT: This manuscript presents a simple method for excess minority carriers’
lifetime measurement within
the base region of p-n junction polycrystalline solar cell in transient mode. This
work is an experimental transient 3-Dimensionnal study. The magnitude of the
magnetic field B is varied from 0 mT to 0.045 mT. Indeed, the solar cell is
illuminated by a stroboscopic flash with air mass 1.5 and under magnetic field in transient state. The experimental details are
assumed in a figure. The procedure is outlined by the Open Circuit Voltage
Decay analysis. Effective minority carrier life-time is calculated by fitting
the linear zone of the transient voltage decay curve because linear decay is an ideal decay. The
kaleidagraph software permits access to the slope of the curve which is
inversely proportional to the lifetime.
The external magnetic effects on
minority carriers’ effective lifetime is then presented
and analyzed. The
analysis shows that the
charge carrier’s
effective lifetime decrease with the magnetic field increase.